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Microscopic modelling of defects production and their annealing after irradiation in silicon for HEP particle detectors

机译:HEP粒子探测器在硅辐照后缺陷产生及其退火的微观建模

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摘要

In this contribution, the production of defects in radiation fields and their evolution toward equilibrium in silicon for detector uses has been modelled. In the quantitative model developed, the generation rate of primary defects is calculated starting from the projectile - silicon interaction and from recoil energy redistribution in the lattice. Vacancy-interstitial annihilation, interstitial migration to sinks, divacancy and vacancy-impurity complex (VP, VO, V2O, CiOi and CiCs) formation are considered. The results of the model support the experimental available data. The correlation between the initial material parameters, temperature, irradiation and annealing history is established. The model predictions could be a useful clue in obtaining harder materials for detectors at the new generation of accelerators or for space missions.
机译:在此贡献中,已对辐射场中缺陷的产生及其在检测器用途中的硅向平衡的演化进行了建模。在开发的定量模型中,主要缺陷的发生率是从弹丸-硅相互作用和晶格中的反冲能量重新分布开始计算的。考虑了空位间隙ni灭,间隙迁移至汇,空位和空位杂质复合物(VP,VO,V2O,CiOi和CiCs)的形成。模型的结果支持实验可用数据。建立了初始材料参数,温度,辐照和退火历史之间的相关性。在为新一代加速器或太空任务的探测器获得更硬的材料时,模型预测可能是有用的线索。

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